| Institute for Semiconductor Physics, University of Göttingen |
| GaN based heterostructures |
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The
microstructure will be investigated by transmission electron microscopy
(TEM); a spatial resolved chemical composition is obtained by energy
dispersive X-ray analysis (EDX). |
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Forschungszentrum
Jülich D-52425 Jülich |
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Contact | Imprint | 1.08.2010 |